GENEVA, Sept. 18 -- NATIONAL INSTITUTE OF METROLOGY, CHINA filed a patent application (CN2025/094705) for “ONLINE SPECTRAL-PEAK CALIBRATION SYSTEM AND METHOD FOR DUAL-COMB COHERENT RAMAN SPECTROSCOPIC MEASUREMENT”. With publication no. WO/2026/183951, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01N 21/65
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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