INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "LAYER 1 MEASUREMENT EVALUATION WITH INTER-CELL BEAM CONNECTION"

GENEVA, Feb. 16 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/071631) for "LAYER 1 MEASUREMENT EVALUATION WITH INTER-CELL BEAM CONNECTION" on Jul 28, 2025. With publication no. WO/2026/032780, the details related to the patent application was published on Feb 12, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GOYAL, Sanjay (Nokia of America Corporation600-700 Mountain AvenueMurray Hill, New Jersey 07974-0636), KOSKELA, Timo (Nokia Solutions and Networks OyRitaharjuntie 390590 Oulu)

Abstract: A method is provided that includes operating with a conf...