INTERNATIONAL PATENT: NEC LABORATORIES AMERICA, INC. FILES APPLICATION FOR "OPTICAL LINE SYSTEM PHYSICAL DIGITAL MODEL CALIBRATION USING A DIFFERENTIAL ALGORITHM"

GENEVA, April 29 -- NEC LABORATORIES AMERICA, INC. (Suite 2004 Independence WayPrinceton, New Jersey 08540) filed a patent application (PCT/US2025/051520) for "OPTICAL LINE SYSTEM PHYSICAL DIGITAL MODEL CALIBRATION USING A DIFFERENTIAL ALGORITHM" on Oct 17, 2025. With publication no. WO/2026/085475, the details related to the patent application was published on Apr 23, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BORRACCINI, Giacomo (1806 Deer Creek DrivePlainsboro, New Jersey 08536)

Abstract: A differential algorithm and method for calibrating a physical digital model, or digital twin, ...