INTERNATIONAL PATENT: NEARFIELD INSTRUMENTS B.V. FILES APPLICATION FOR "CANTILEVER FOR SINGLE LASER ATOMIC FORCE MICROSCOPE"

GENEVA, March 24 -- NEARFIELD INSTRUMENTS B.V. (Vareseweg 53047 AT Rotterdam) filed a patent application (PCT/NL2025/050448) for "CANTILEVER FOR SINGLE LASER ATOMIC FORCE MICROSCOPE" on Sep 09, 2025. With publication no. WO/2026/059443, the details related to the patent application was published on Mar 19, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PISKUNOV, Taras Sergeievich (c/o Vareseweg 53047 AT Rotterdam)

Abstract: Cantilever for use in an atomic force microscope comprising an absorption layer provided on the cantilever facing an optical system such that, during use, a first fract...