GENEVA, Feb. 23 -- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY (3-1, Kasumigaseki 1-chome, Chiyoda-ku, Tokyo1008921), 国立研究開発法人産業技術総合研究所 (東京都千代田区霞が関一丁目３番１号) filed a patent application (PCT/JP2025/028592) for "METHOD FOR MEASURING K VALUE" on Aug 13, 2025. With publication no. WO/2026/038562, the details related to the patent application was published on Feb 19, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is manage...