GENEVA, Oct. 1 -- EN CARTA DIAGNOSTICS filed a patent application (EP2026/056642) for “MICRONEEDLE SAMPLING DEVICE”. With publication no. WO/2026/190123, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: A61B 5/15
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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