INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "MEMORY DEVICE BAD COLUMN IDENTIFICATION AND COMPENSATION"

GENEVA, March 11 -- MICRON TECHNOLOGY, INC. (8000 South Federal WayBoise, Idaho 83716-9632) filed a patent application (PCT/US2025/039461) for "MEMORY DEVICE BAD COLUMN IDENTIFICATION AND COMPENSATION" on Jul 28, 2025. With publication no. WO/2026/049923, the details related to the patent application was published on Mar 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WAN, Jun (5777 Trowbridge WaySan Jose, California 95138), TAI, Ying (1439 Todd StreetMountain View, California 94040), WANG, Wei (3369 Monaghan StreetDublin, California 94568), ZHOU, Zhenming (1273 Avenida Las BrisasSan Jos...