International Patent: METHOD OF MAPPING ONE OR MORE FEATURES ON OR BELOW A SUBSTRATE SURFACE USING A SCANNING PROBE MICROSCOPY DEVICE.

GENEVA, June 19 -- NEARFIELD INSTRUMENTS B.V. filed a patent application (NL2025/050573) for “METHOD OF MAPPING ONE OR MORE FEATURES ON OR BELOW A SUBSTRATE SURFACE USING A SCANNING PROBE MICROSCOPY DEVICE.”. With publication no. WO/2026/106478, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01Q 30/06

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Disclaimer: Curated by HT Syndication....