International Patent: METHOD OF IN-SITU INSPECTION OF A PLURALITY OF LAYERS, VACUUM DEPOSITION SYSTEM, AND SUBSTRATE

GENEVA, June 19 -- APPLIED MATERIALS, INC. filed a patent application (US2024/056386) for “METHOD OF IN-SITU INSPECTION OF A PLURALITY OF LAYERS, VACUUM DEPOSITION SYSTEM, AND SUBSTRATE”. With publication no. WO/2026/106610, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: C23C 14/54

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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