International Patent: METHOD FOR REDUCING IMPACT OF QUASI-PARTICLE DEFECTS ON BITS AND USE THEREOF

GENEVA, July 2 -- YANGTZE DELTA INDUSTRIAL INNOVATION CENTER OF QUANTUM SCIENCE AND TECHNOLOGY filed a patent application (CN2025/136811) for “METHOD FOR REDUCING IMPACT OF QUASI-PARTICLE DEFECTS ON BITS AND USE THEREOF”. With publication no. WO/2026/130028, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: H10N 60/01

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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