International Patent: METHOD FOR MEASURING DATA REPRESENTATIVE OF THE CONCENTRATION OF AT LEAST ONE TRACER GAS OR OF A SET OF GASES COMPRISING THE TRACER GAS, AND ASSOCIATED METHOD AND ASSEMBLY

GENEVA, Aug. 14 -- TOTALENERGIES ONETECH filed a patent application (EP2026/053252) for “METHOD FOR MEASURING DATA REPRESENTATIVE OF THE CONCENTRATION OF AT LEAST ONE TRACER GAS OR OF A SET OF GASES COMPRISING THE TRACER GAS, AND ASSOCIATED METHOD AND ASSEMBLY”. With publication no. WO/2026/167203, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01N 21/3504

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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