GENEVA, Sept. 7 -- RESONAC CORPORATION filed a patent application (JP2026/007544) for “METHOD FOR MEASURING CRYSTAL ORIENTATION OF SIC SINGLE CRYSTAL, METHOD FOR MANUFACTURING SIC SUBSTRATE, METHOD FOR MANUFACTURING SIC BOULE, SIC SINGLE CRYSTAL, SIC SUBSTRATE, SIC EPITAXIAL WAFER, SIC DEVICE, AND METHOD FOR MANUFACTURING SIC DEVICE”. With publication no. WO/2026/182244, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: C30B 29/36
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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