GENEVA, Sept. 18 -- KABUSHIKI KAISHA KOBE SEIKO SHO (KOBE STEEL, LTD.) filed a patent application (JP2026/004057) for “METHOD FOR EVALUATING QUALITY OF SIC SEMICONDUCTOR”. With publication no. WO/2026/186381, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: H10P 74/20
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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