International Patent: METHOD FOR DETERMINING ONE OR MORE STATE PARAMETERS OF A MULTI-BEAM CHARGED PARTICLE IMAGING SYSTEM, METHOD FOR RESTORING AN IMAGE ACQUIRED BY A MULTI-BEAM CHARGED PARTICLE IMAGING SYSTEM, AND CORRESPONDING COMPUTER PROGRAM AND SYSTEM

GENEVA, Aug. 31 -- CARL ZEISS MULTISEM GMBH filed a patent application (EP2026/053610) for “METHOD FOR DETERMINING ONE OR MORE STATE PARAMETERS OF A MULTI-BEAM CHARGED PARTICLE IMAGING SYSTEM, METHOD FOR RESTORING AN IMAGE ACQUIRED BY A MULTI-BEAM CHARGED PARTICLE IMAGING SYSTEM, AND CORRESPONDING COMPUTER PROGRAM AND SYSTEM”. With publication no. WO/2026/175723, here are the other details related to the patent application:

Kind: Initial Publication without ISR [A2]

IPC: H01J 37/21

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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