International Patent: METHOD FOR DEPOSITING A METAL ONTO A SAMPLE BY FOCUSED CHARGED PARTICLE BEAM INDUCED DEPOSITION

GENEVA, June 26 -- ORSAY PHYSICS filed a patent application (EP2025/084121) for “METHOD FOR DEPOSITING A METAL ONTO A SAMPLE BY FOCUSED CHARGED PARTICLE BEAM INDUCED DEPOSITION”. With publication no. WO/2026/119633, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: C23C 16/04

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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