GENEVA, Sept. 24 -- UNITY SEMICONDUCTOR filed a patent application (EP2026/056638) for “METHOD AND DEVICE FOR POLARIMETRIC CRYSTALLOGRAPHIC DEFECT DETECTION”. With publication no. WO/2026/195426, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01N 21/95
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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