GENEVA, Aug. 7 -- SICK K.K. filed a patent application (JP2026/000663) for “METHOD AND DEVICE FOR DETERMINING MAXIMUM INTENSITY OF LINE LASER ARRAY”. With publication no. WO/2026/163800, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01J 1/42
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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