GENEVA, Sept. 24 -- SAMSUNG SDI CO., LTD. filed a patent application (KR2025/010475) for “METHOD AND APPARATUS FOR DETECTING OPEN CIRCUIT OF FUSE”. With publication no. WO/2026/197480, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01R 31/74
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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