International Patent: MEASURING CONCENTRATION OF NANOPARTICLES USING INTERFEROMETRIC NANOPARTICLE TRACKING ANALYSIS

GENEVA, July 18 -- MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E. V. filed a patent application (EP2025/050291) for “MEASURING CONCENTRATION OF NANOPARTICLES USING INTERFEROMETRIC NANOPARTICLE TRACKING ANALYSIS”. With publication no. WO/2026/149637, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01N 15/075

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Disclaimer: Curated by HT Syndication....