International Patent: MEASURING APPARATUS FOR EDGE PROFILE EXAMINATION, IN PARTICULAR EDGE PROFILE DETERMINATION AND/OR EDGE INSPECTION, OF A MEASUREMENT OBJECT, IN PARTICULAR A WAFER, AND METHOD THEREFOR

GENEVA, Aug. 14 -- PRIEWALD, Robin filed a patent application (AT2026/060032) for “MEASURING APPARATUS FOR EDGE PROFILE EXAMINATION, IN PARTICULAR EDGE PROFILE DETERMINATION AND/OR EDGE INSPECTION, OF A MEASUREMENT OBJECT, IN PARTICULAR A WAFER, AND METHOD THEREFOR”. With publication no. WO/2026/165600, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01B 11/24

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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