International Patent: MEASUREMENT METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, PROGRAM, AND RESISTIVITY MEASURING DEVICE

GENEVA, Oct. 5 -- KOKUSAI ELECTRIC SEMICONDUCTOR SERVICE INC. filed a patent application (JP2026/012559) for “MEASUREMENT METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, PROGRAM, AND RESISTIVITY MEASURING DEVICE”. With publication no. WO/2026/205412, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: H10P 74/20

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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