GENEVA, Oct. 22 -- PSK INC. filed a patent application (KR2026/004581) for “MEASUREMENT JIG, METHOD FOR MANUFACTURING MEASUREMENT JIG, AND METHOD FOR MEASURING ELECTRICAL CHARACTERISTICS OF SUPPORT UNIT”. With publication no. WO/2026/221298, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01R 31/00
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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