GENEVA, March 29 -- MCMASTER UNIVERSITY (1280 Main Street WestHamilton, Ontario L8S 4L8) filed a patent application (PCT/CA2025/051236) for "METHOD FOR DETECTING AND DIAGNOSING FAULTS" on Sep 18, 2025. With publication no. WO/2026/060526, the details related to the patent application was published on Mar 26, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): GERAEI, Hosna (125 Shoreview Place, Suite 210Hamilton, Ontario L8E 0K3), HABIBI, Saeid (1093 North Service RdStoney Creek, Ontario L8E 5E1)
Abstract: Various embodiments are described herein for a system and method for condition monitoring...