International Patent: MATERIAL TO BE IRRADIATED WITH RADIATION AND RADIATION DOSE MEASURING DEVICE

GENEVA, Oct. 15 -- TOKYO METROPOLITAN PUBLIC UNIVERSITY CORPORATION filed a patent application (JP2026/014690) for “MATERIAL TO BE IRRADIATED WITH RADIATION AND RADIATION DOSE MEASURING DEVICE”. With publication no. WO/2026/216601, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: C09K 11/00

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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