GENEVA, July 2 -- NATIONAL INSTITUTE OF METROLOGY OF CHINA filed a patent application (CN2025/070085) for “MACHINE-READABLE DIGITAL REFERENCE MATERIAL CERTIFICATE GENERATION METHOD”. With publication no. WO/2026/129435, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06F 21/33

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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