GENEVA, July 1 -- ON FLOW, LLC. filed a patent application (JP2024/043913) for “LINE QUALITY MEASUREMENT METHOD AND LINE QUALITY MEASUREMENT SYSTEM”. With publication no. WO/2026/126406, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: H04L 43/08
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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