INTERNATIONAL PATENT: LG MANAGEMENT DEVELOPMENT INSTITUTE CO., LTD., 주식회사 엘지 경영개발원 FILES APPLICATION FOR "SUSPECTED DEFECT REGION DETECTION METHOD AND SYSTEM THEREFOR"

GENEVA, April 7 -- LG MANAGEMENT DEVELOPMENT INSTITUTE CO., LTD. (128, Yeoui-daero,Yeongdeungpo-gu,Seoul 07336), 주식회사 엘지 경영개발원 (서울특별시영등포구여의대로 128) filed a patent application (PCT/KR2025/014499) for "SUSPECTED DEFECT REGION DETECTION METHOD, AND SYSTEM THEREFOR" on Sep 18, 2025. With publication no. WO/2026/071614, the details related to the patent application was published on Apr 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor...