INTERNATIONAL PATENT: LEENO INDUSTRIAL INC. FILES APPLICATION FOR "TEST PROBE"

GENEVA, Feb. 23 -- LEENO INDUSTRIAL INC. (10, MieumSandan-ro 105beon-gil,Gangseo-gu,Busan 46748) filed a patent application (PCT/KR2025/011028) for "TEST PROBE" on Jul 24, 2025. With publication no. WO/2026/038746, the details related to the patent application was published on Feb 19, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KIM, Geunsu (10, Mieumsandan-ro 105beon-gil,Gangseo-gu,Busan 46748)

Abstract: According to an embodiment of the disclosure, there is provided a test probe for testing electrical characteristics of an object to be tested. The test probe includes: a barrel includin...