GENEVA, April 28 -- LEENO INDUSTRIAL INC. (10, MieumSandan-ro 105beon-gil,Gangseo-gu,Busan 46748) filed a patent application (PCT/KR2025/016026) for "TEST DEVICE" on Oct 13, 2025. With publication no. WO/2026/084385, the details related to the patent application was published on Apr 23, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): JEONG, Jaehwan (10, Mieumsandan-ro 105beon-gil,Gangseo-gu,Busan 46748)
Abstract: Disclosed is a test device for testing electrical characteristics of a test object. The test device includes: a socket body including an upper block and a lower block arranged so t...