GENEVA, March 3 -- KONICA MINOLTA, INC. (2-7-2, Marunouchi, Chiyoda-ku, Tokyo1007015), コニカミノルタ株式会社 (東京都千代田区丸の内二丁目７番２号) filed a patent application (PCT/JP2025/027871) for "INSPECTION/EXAMINATION DEVICE, INSPECTION/EXAMINATION SYSTEM, AND INSPECTION/EXAMINATION METHOD" on Aug 06, 2025. With publication no. WO/2026/042572, the details related to the patent application was published on Feb 26, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Prope...