INTERNATIONAL PATENT: KABUSHIKI KAISHA NIHON MICRONICS, 株式会社日本マイクロニクス FILES APPLICATION FOR "PROBE AND PROBE MANUFACTURING METHOD"

GENEVA, March 17 -- KABUSHIKI KAISHA NIHON MICRONICS (6-8, Kichijojihoncho 2-chome, Musashino-shi, Tokyo1808508), 株式会社日本マイクロニクス (東京都武蔵野市吉祥寺本町２丁目６番８号) filed a patent application (PCT/JP2025/028129) for "PROBE, AND PROBE MANUFACTURING METHOD" on Aug 07, 2025. With publication no. WO/2026/053677, the details related to the patent application was published on Mar 12, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Prop...