GENEVA, Aug. 7 -- HITACHI HIGH-TECH CORPORATION filed a patent application (JP2025/002643) for “INSPECTION MEASUREMENT SYSTEM AND SAMPLE INSPECTION MEASUREMENT METHOD”. With publication no. WO/2026/163275, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: H01J 37/26
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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