GENEVA, June 19 -- HAMAMATSU PHOTONICS K.K. filed a patent application (JP2025/025920) for “INSPECTION DEVICE AND INSPECTION METHOD”. With publication no. WO/2026/105388, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01M 11/00
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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