International Patent: INSERTION TESTING MECHANISM FOR MEMORY CHIP TESTING

GENEVA, June 24 -- SHANGHAI U-EASTAR ELECTRO-MECHANICAL CO., LTD. filed a patent application (CN2025/117189) for “INSERTION TESTING MECHANISM FOR MEMORY CHIP TESTING”. With publication no. WO/2026/113548, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01R 31/28

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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