International Patent: IMAGING OF NONPLANAR SEMICONDUCTOR-BASED STRUCTURES USING A SCANNING ELECTRON MICROSCOPE

GENEVA, July 31 -- CARL ZEISS MULTISEM GMBH filed a patent application (EP2025/069430) for “IMAGING OF NONPLANAR SEMICONDUCTOR-BASED STRUCTURES USING A SCANNING ELECTRON MICROSCOPE”. With publication no. WO/2026/017489, here are the other details related to the patent application:

Kind: Later publication of international search report [A3]

IPC: H01J 37/21

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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