GENEVA, May 19 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2025/020752) for "MANUFACTURING INSPECTION SYSTEM, MANUFACTURING INSPECTION METHOD, MANUFACTURING INSPECTION DEVICE, AND PROGRAM" on Jun 09, 2025. With publication no. WO/2026/100123, the details related to the patent application was published on May 15, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intell...