INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "IMAGE DIAGNOSIS SUPPORT DEVICE, IMAGE DIAGNOSIS SUPPORT METHOD AND RECORDING MEDIUM"

GENEVA, March 10 -- HITACHI HIGH-TECH CORPORATION (1-17-1 Toranomon, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2025/015064) for "IMAGE DIAGNOSIS SUPPORT DEVICE, IMAGE DIAGNOSIS SUPPORT METHOD, AND RECORDING MEDIUM" on Apr 17, 2025. With publication no. WO/2026/048127, the details related to the patent application was published on Mar 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (W...