GENEVA, Feb. 17 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/028162) for "FINE-MOTION CONTROL SYSTEM, SCANNING PROBE MICROSCOPE, FINE-MOTION UNIT CONTROL METHOD, AND SCANNING MICROSCOPE CONTROL METHOD" on Aug 06, 2024. With publication no. WO/2026/033663, the details related to the patent application was published on Feb 12, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by...