INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク, FUJITA ACADEMY, 学校法人藤田学園 FILES APPLICATION FOR "INSPECTION DELAY MONITORING DEVICE AND INSPECTION DELAY DETECTION METHOD"

Posted On: 2026-05-05

GENEVA, May 5 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号), FUJITA ACADEMY (1-98, Dengakugakubo, Kutsukake-cho, Toyoake-shi, Aichi4701192), 学校法人藤田学園 (愛知県豊明市沓掛町田楽ケ窪１番地９８) filed a patent application (PCT/JP2025/026629) for "INSPECTION DELAY MONITORING DEVICE AND INSPECTION DELAY DETECTION METHOD" on Jul 28, 2025. Wit...

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INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク, FUJITA ACADEMY, 学校法人藤田学園 FILES APPLICATION FOR "INSPECTION DELAY MONITORING DEVICE AND INSPECTION DELAY DETECTION METHOD"