INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク, FUJITA ACADEMY, 学校法人藤田学園 FILES APPLICATION FOR "INSPECTION DELAY MONITORING DEVICE AND INSPECTION DELAY DETECTION METHOD"

Posted On: 2026-05-05

GENEVA, May 5 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号), FUJITA ACADEMY (1-98, Dengakugakubo, Kutsukake-cho, Toyoake-shi, Aichi4701192), 学校法人藤田学園 (愛知県豊明市沓掛町田楽ケ窪１番地９８) filed a patent application (PCT/JP2025/026629) for "INSPECTION DELAY MONITORING DEVICE AND INSPECTION DELAY DETECTION METHOD" on Jul 28, 2025. Wit...

Click here to read full article from source

To read the full article or to get the complete feed from this publication, please Contact Us.

Exclusive

Category

Source

Publication

Location

INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク, FUJITA ACADEMY, 学校法人藤田学園 FILES APPLICATION FOR "INSPECTION DELAY MONITORING DEVICE AND INSPECTION DELAY DETECTION METHOD"