International Patent: HIGH-RESOLUTION ELLIPSOMETRIC MICROSCOPE AND MEASURING METHOD USING SAME

GENEVA, July 1 -- NANO-VIEW. CO.,LTD filed a patent application (KR2025/004912) for “HIGH-RESOLUTION ELLIPSOMETRIC MICROSCOPE AND MEASURING METHOD USING SAME”. With publication no. WO/2026/127216, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01N 21/21

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Disclaimer: Curated by HT Syndication....