International Patent: GENERAL PURPOSE INPUT/OUTPUT TEST SYSTEM, AND SYSTEM-ON-CHIP COMPRISING SAME

GENEVA, Aug. 31 -- ITDA SEMICONDUCTOR CO.,LTD. filed a patent application (KR2026/002160) for “GENERAL PURPOSE INPUT/OUTPUT TEST SYSTEM, AND SYSTEM-ON-CHIP COMPRISING SAME”. With publication no. WO/2026/177433, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06F 30/333

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Disclaimer: Curated by HT Syndication....