INTERNATIONAL PATENT: GEBZE TEKNIK UNIVERSITESI FILES APPLICATION FOR "METHOD FOR DETERMINATION OF NON-UNIFORM IMAGE COORDINATE SYSTEM IN PANORAMIC IMAGING WITH K-MEANS ALGORITHM"

GENEVA, April 14 -- GEBZE TEKNIK UNIVERSITESI (Gebze Teknik Universitesi Rektorlugu P.K. 14141400 Gebze/Kocaeli) filed a patent application (PCT/TR2024/051118) for "METHOD FOR DETERMINATION OF NON-UNIFORM IMAGE COORDINATE SYSTEM IN PANORAMIC IMAGING WITH K-MEANS ALGORITHM" on Oct 01, 2024. With publication no. WO/2026/075625, the details related to the patent application was published on Apr 09, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ERGUN, Bahadir (Gebze Teknik Universitesi Harita Muhendisligi Bolumu41400 Kocaeli)

Abstract: The invention relates to a method for determination of no...