INTERNATIONAL PATENT: FUNDACION TECNALIA RESEARCH & INNOVATION FILES APPLICATION FOR "METHOD FOR TRAINING AT LEAST ONE MACHINE LEARNING MODEL THAT IS USABLE FOR ESTIMATING THE IMMISSION OF PARTICLES AT AT LEAST ONE LOCATION AND SYSTEM"

GENEVA, May 4 -- FUNDACION TECNALIA RESEARCH & INNOVATION (Parque Cientifico y Tecnologico de GipuzkoaMikeletegi Pasealekua, 2Guipuzcoa20009 San Sebastian) filed a patent application (PCT/EP2025/079732) for "METHOD FOR TRAINING AT LEAST ONE MACHINE LEARNING MODEL THAT IS USABLE FOR ESTIMATING THE IMMISSION OF PARTICLES AT AT LEAST ONE LOCATION, AND SYSTEM" on Oct 15, 2025. With publication no. WO/2026/087306, the details related to the patent application was published on Apr 30, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): AROSTEGI PEREZ, Maria (Parque Cientifico y Tecnologico de Gipuzkoa...