GENEVA, May 10 -- FREIBERGER COMPOUND MATERIALS GMBH (Am Junger Lowe Schacht 509599 Freiberg) filed a patent application (PCT/EP2025/077194) for "DEVICE AND METHOD FOR DETECTING AND CHARACTERIZING PARTICLES AND OTHER DEFECTS ON SEMICONDUCTOR WAFERS, IN PARTICULAR GALLIUM ARSENIDE WAFERS" on Sep 23, 2025. With publication no. WO/2026/092921, the details related to the patent application was published on May 07, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): SCHEFFER-CZYGAN, Max (Weststr. 11709116 Chemnitz), FLIEGEL, Wolfram (Kaitzer Str. 6201187 Dresden)
Abstract: The present invention rela...