International Patent: FAILURE DETECTION METHOD APPLIED TO HETEROGENEOUS TRAINING CLUSTER

GENEVA, Sept. 7 -- SHANGHAI ARTIFICIAL INTELLIGENCE INNOVATION CENTER filed a patent application (CN2025/116971) for “FAILURE DETECTION METHOD APPLIED TO HETEROGENEOUS TRAINING CLUSTER”. With publication no. WO/2026/179096, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06F 11/07

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Disclaimer: Curated by HT Syndication....