INTERNATIONAL PATENT: EXCELLENCE LOGGING FRANCE FILES APPLICATION FOR "METHOD FOR DETERMINING A MAGNIFICATION FOR ANALYSING AT LEAST ONE GEOLOGICAL SAMPLE, ASSOCIATED METHOD AND APPARATUS"

GENEVA, March 30 -- EXCELLENCE LOGGING FRANCE (Batiment Alley 50 Bis 56/58 Avenue Jean Jaures92700 COLOMBES) filed a patent application (PCT/EP2025/076724) for "METHOD FOR DETERMINING A MAGNIFICATION FOR ANALYSING AT LEAST ONE GEOLOGICAL SAMPLE, ASSOCIATED METHOD AND APPARATUS" on Sep 18, 2025. With publication no. WO/2026/062144, the details related to the patent application was published on Mar 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PEYRET, Aymeric-Pierre (33 rue Camille Corot92500 RUEIL MALMAISON), JARRAULT, Thomas (183, rue Simone de Beauvoir42153 RIORGES), KASPRZYKOWSKI, Pa...