International Patent: EXAMINATION MACHINE ADAPTER, EXAMINATION MACHINE, AND EXAMINATION METHOD

GENEVA, July 9 -- TEIKYO UNIVERSITY filed a patent application (JP2025/041721) for “EXAMINATION MACHINE ADAPTER, EXAMINATION MACHINE, AND EXAMINATION METHOD”. With publication no. WO/2026/146598, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: A61B 3/14

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Disclaimer: Curated by HT Syndication....