GENEVA, Sept. 18 -- YAMAHA FINE TECHNOLOGIES CO.,LTD. filed a patent application (JP2026/005544) for “ELECTRICAL INSPECTION JIG, PROBE UNIT, AND ELECTRICAL INSPECTION DEVICE”. With publication no. WO/2026/186447, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01R 1/06
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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