INTERNATIONAL PATENT: DIT-MCO INTERNATIONAL LLC FILES APPLICATION FOR "CALIBRATED ELECTRICAL CONTINUITY DETECTOR"

GENEVA, Feb. 24 -- DIT-MCO INTERNATIONAL LLC (5612 Brighton TerraceKansas City, Missouri 64130) filed a patent application (PCT/US2025/042170) for "CALIBRATED ELECTRICAL CONTINUITY DETECTOR" on Aug 15, 2025. With publication no. WO/2026/039735, the details related to the patent application was published on Feb 19, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SHIER, David Alan (5612 Brighton TerraceKansas City, Missouri 64130)

Abstract: A continuity detector for determining the continuity of a Unit Under Test (UUT). The detector comprises a housing defining an interior volume, an electron...